Jandel RM3000

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Description

Jandel RM3000 4 point probe (NEW UNUSED) with 200mm wafer platform

Probe: 100mm tip spacing, 60+ grams force, Tungsten Carbide, Tip Ru 100 (100 microns tip radius)

200mm vacuum wafer chuck supports 5,6,8 inch wafers

preset measurement positions at center and four radii

shrouded measurement area to eliminate light interference

RM3000 constant current power supply and voltage measurement unit


Specifications

ManufacturerJandel
ModelRM3000
ConditionUsed
Stock NumberEM998