Hitachi

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Used Hitachi

AMAT P5000

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Used AMAT P5000
AMAT P5000 8" Ox CVD Alpha Silicon WAFER SIZE: 8"

2005 Nissin EXCEED2000A

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Used 2005 Nissin EXCEED2000A
8" Frame Offline, Broken

Nanometrics Nanospec/AFT M6100

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Used Nanometrics Nanospec/AFT M6100
8" Configuration overview: Nanospec/AFT M6099 Filk thick Tool status: offline, broken

1999 KLA AMRAY4200C

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Used 1999 KLA AMRAY4200C
Metrology 8" Inspection system SEM

2001 Hitachi WA200

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Used 2001 Hitachi WA200
Hitachi WA200 FAB SMIFF interface Wide area scanning probe microscope WAFER SIZE: 8"

Akrion Gamma

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Used Akrion Gamma
Wafer size: 8" Configuration overview: ST28, PSR, QDR, SD Process overview: solvent Tool statu...

Carl Zeiss Group Axiotron 300

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Used Carl Zeiss Group	 Axiotron 300
Carl Zeiss Group Axiotron 300 Microscope Currently Configured for 300mm wafer size EQUIPMENT D...

2008 Tokyo Electron Ltd. Telius SP-305 SCCM

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Used 2008 Tokyo Electron Ltd. Telius SP-305 SCCM
Vintage: 2008 (1) 2007 (1) 2005 (1) 2003 (1) Wafer size: 300mm Asset HDD not included Soft...

Canon ANELVA ILC 1060 PVD 5 Inch

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Used Canon ANELVA ILC 1060 PVD
As is

2009 Applied Materials AMAT Centura AP DPS AdvantEdge G2 Poly

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Used 2009 Applied Materials AMAT Centura AP DPS AdvantEdge G2 Poly
Vintage: 2009 (1) 2005 (1) Wafer size: 300mm Asset HDD not included Qty- 4 -Not overhaul Are...

2016 Advanced Technology Inc. Cypress GEN2

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Used 2016 Advanced Technology Inc. Cypress GEN2
Vintage: 2016 Brightness controller of 2D measurement need to be exchanged Please inspect tool ...