2023 Takano WM-7S Unpatterned Wafer Surface Inspection Tool

2023 Takano WM-7S Unpatterned Wafer Surface Inspection Tool

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Description

405nm Laser Source

Particle Detection Down to 79 nm

Unused Since Installation/Qualification

Configured for 200mm Wafers

Manufactured in 2023

Cassette to Cassette YES

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Specifications

ManufacturerTakano
ModelWM-7S Unpatterned Wafer Surface Inspection Tool
Year2023
ConditionUsed
Stock NumberBM5880