2013 Bruker Contour GT-X

2013 Bruker Contour GT-X

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Description

Two Chambers

  • One 2013
  • One 2016


With wafer Mate 200 Wafer Sorting Robot


The ContourGT-X 3D Optical Profiler provides the highest performing non-contact surface measurements for laboratory research and production process control. Incorporating ten generations of white light interferometry (WLI) innovation and design, this metrology system delivers the highest vertical resolution over the industry’s largest field of view. Key features include full automation and a production interface, a large motorized XYZ stage, tip/tilt in the head, and an integral air isolation table. Designed from the ground up for the most demanding R&D, quality assurance, and process quality control needs, the ContourGT-X offers the ultimate in gage-capable 3D optical accuracy and robustness.

Specifications

ManufacturerBruker
ModelContour GT-X
Year2013
ConditionUsed
Stock NumberBM1673