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This system was removed from a university lab as surplus to requirements. Whilst we have not tes...

JEOL JWS-7555 SEM - Defect Review (DR) Currently Configured for 200mm wafer size MFG Date: TBC...

Resolution: 1.2 nm at 30 kV, 3.0 nm at 1.0 kV Accelerating Voltage: 0.5 to 30 kV Specimen Stage...

- With a gatan camera for TEM - STEM module - Selection of BF/DF/HAADF detectors for STEM 2000...

This Jeol JSM-6460LV Scanning Electron Microscope was removed from a lab that was being shut down...

LAB Tool

Used

- Model No: JSM-6300F Column - Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope Sys...

- Model No: JSM-6400F Column - Made in Japan Installed Components - Part No: BEI Preamplifier -...

This Jeol JSM-6700F Field Emission Scanning Electron Microscope Edax Detector is in good cosmetic...

- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with E...

Condition : good ,as is where is Further specs in images