Nikon MM-40 Measurement Microscope

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Used Nikon MM-40 Measurement Microscope
Suitable for parts harvesting only, Sold As Is Included 2 Objectives ( one front glass damage)

JEOL 7555 Wafer Inspection System

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Used JEOL 7555 Wafer Inspection System

Vistec LDS3300 M

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Used Vistec LDS3300 M

August NSX-90

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Used August NSX-90
Configuration: August NSX-90 is a macro defect inspection tool solution used through out the devi...

Applied Materials Excite Wafer inspection Tool

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Used Applied Materials Excite Wafer inspection Tool
As per photo's Sold As Is , open to offers,

Rudolph 105C Wafer inspection System

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Used Rudolph 105C Wafer inspection System
Refurbished to OEM Specs Rudolph/August Wafer Inspection System Model:NSX-105C Vintage:2006 SN:NS...

FEI XL40 Cross-section SEM

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Used FEI XL40 Cross-section SEM
FEI XL40 CROSS SECTION SEM WORKING CONDITION refurbished AVAILABLE IN WAREHOUSE

SMT Inspection microscope. temp listing.

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Used SMT Inspection microscope. temp listing.
[video width="1920" height="1080" mp4="http://www.tarasemi.com/wp-content/uploads/2019/10/2019100...

Veeco Wyko NT8000 Optical Profiling System

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Used Veeco Wyko NT8000 Optical Profiling System
Hard Drive and software not included

KLA EV300

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Used KLA EV300

Sun International Sopra GESP-5

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Used Sun International Sopra GESP-5
Sold fully tested and in good working condition. Variable Angle Broadband Spectroscopic Ellipsome...