RUDOLPH WV320 300mm

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Used RUDOLPH WV320 300mm
RUDOLPH WV320 Wafer size: 300mm Process: measurement

SOPRA model SE 200

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Used SOPRA model SE 200
Inspection System. Status: In Storage 8"

Philips Model PQ Ruby PZ2500 Ellipsometer

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Used Philips Model PQ Ruby PZ2500 Ellipsometer
Philips Model PQ Ruby PZ2500 Ellipsometer Ellipsometer system

KLA-Tencor Flx 2908

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Used KLA-Tencor Flx 2908
FLX-2908 Setup for 200mm Wafers Comes with Neslab CFT-25 Chiller, PC, Keyboard, Monitorand Printe...

Nikon MM-40 Measurement Microscope

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Used Nikon MM-40 Measurement Microscope
Suitable for parts harvesting only, Sold As Is Included 2 Objectives ( one front glass damage)

KLA 6200 Wafer inspection

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Used KLA 6200 Wafer inspection
Sold As Is Complete Working condition

KLA 2132 Wafer Inspection System

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Used KLA 2132 Wafer Inspection System
Serial number W21XX639 can be sold "as is" or operational to oem specs. Deinstalled by KLA, Wareh...

JEOL 7555 Wafer Inspection System

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Used JEOL 7555 Wafer Inspection System

Vistec LDS3300 M

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Used Vistec LDS3300 M

August NSX-90

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Used August NSX-90
Configuration: August NSX-90 is a macro defect inspection tool solution used through out the devi...

Applied Materials Excite Wafer inspection Tool

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Used Applied Materials Excite Wafer inspection Tool
As per photo's Sold As Is , open to offers,

Rudolph 105C Wafer inspection System

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Used Rudolph 105C Wafer inspection System
Refurbished to OEM Specs Rudolph/August Wafer Inspection System Model:NSX-105C Vintage:2006 SN:NS...