FEI XL40 Cross-section SEM

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Used FEI XL40 Cross-section SEM
FEI XL40 CROSS SECTION SEM WORKING CONDITION refurbished AVAILABLE IN WAREHOUSE

SMT Inspection microscope. temp listing.

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Used SMT Inspection microscope. temp listing.
[video width="1920" height="1080" mp4="http://www.tarasemi.com/wp-content/uploads/2019/10/2019100...

Veeco Wyko NT8000 Optical Profiling System

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Used Veeco Wyko NT8000 Optical Profiling System
Hard Drive and software not included

KLA EV300

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Used KLA EV300

KLA Puma 9550

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Used KLA Puma 9550
Please send request for full details Wafer Size: 200mm

Sun International Sopra GESP-5

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Used Sun International Sopra GESP-5
Sold fully tested and in good working condition. Variable Angle Broadband Spectroscopic Ellipsome...

KLA-TENCOR ULTRAPOINTE 1010

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Used KLA-TENCOR ULTRAPOINTE 1010
KLA-TENCOR ULTRAPOINTE MODEL 1010 WAFER LASER CONFOCAL IMAGING SYSTEM Used, Sold as-is Looks comp...

JEOL JSM-6320F

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Used JEOL JSM-6320F

Kobelco LTA-600

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Used Kobelco LTA-600
Metrology

Applied Materials Excite IPM 832

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Used Applied Materials Excite IPM 832
High speed wafer Inspection System for bare wafers Wafer Size: 200mm

AMAT Complus 4T Inspection darkfield Inspection system

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Used AMAT Complus 4T Inspection darkfield Inspection system
SW Ver:V10.6(516) Load port: TDK Robot Type:Yaskawa Laser working Hours:87918 hrs Laser Roll Over...