2008 Malvern Panalytical PW-2830 XRF Wafer Analyzer

4, 6 & 8"

capable XRF X-Ray Fluorescence

( and not a  XRD X-Ray Diffraction.   )

Zero drift electron Beam tube retrofitted

The Malvern Panalytical PW-2830) is a high-performance Wavelength Dispersive X-ray Fluorescence (WDXRF) wafer analyzer designed for non-contact, nondestructive, and rapid analysis of layer thickness, composition, and dopant levels on semiconductor wafers