2006 Rudolph MP200 Contactless Metal Thickness Measurement

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Used 2006 Rudolph MP200
Description - MP200 double path tool - non copper tool; double path tool delay stage; - 6 inch c...

2012 Four Dimensions CVMAP 3092-A

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Used 2012 Four Dimensions CVMAP 3092-A
Minimum 150 mm Maximum 300 mm Set Size 200 mm The CVMAP 3092A uses a mercury probe, which is i...

2001 Brooks MTX2000/2 300mm Wafer Sorter

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Used 2001 Brooks MTX2000/2
Condition: Very Good Vintage 2001 Configuration: 12" Wafer sorter with: 2x Fixload V6 Multip...

2004 KLA Viper 2435

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Used 2004 KLA Viper 2435
KLA Viper 2435 As Is. Vintage : 2004. HDDs included, please see the photos. No other informat...

2004 Hitachi S9220 CD-SEM

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Used 2004 Hitachi S9220 CD-SEM
Professionally Deinstalled, skidded in storage Working condition prior to deinstall WAFER SIZE: 150mm

KLA TENCOR 5200XP

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Refurbished KLA TENCOR 5200XP
This is being sold refurbished with a 3 months parts warranty. Its currently configured with SMI...

KLA Tencor ASET F5X Film thickness Measurement 200mm

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Used KLA Tencor ASET F5X  Film thickness Measurement 200mm
Currently Under KLA Service Contract. WAFER SIZE: 200mm

FEI QUANTA 200 3D DualBeam FIB

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Used QUANTA  200 3D DualBeam
The FEI Quanta 200 3D Dual Beam SEM is equipped with a Ga Ion Source. Capable of surface imaging...

KLA Archer 200 Overlay Metology

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Used KLA Archer 200 Overlay Metology
WAFER SIZE: 150mm-300mm, Configured for 300mm

2006 KLA eS32 e-beam wafer inspection 200mm

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Used 2006 KLA eS32 e-beam wafer inspection 200mm
KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equip...

2007 JEOL JWS-2000 WAFER INSPECTION SYSTEM

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Used 2007 JEOL JWS-2000 WAFER INSPECTION SYSTEM
WAFER SIZE: 200mm

AIT CMT-SR2000N WITH OPTION

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Used AIT CMT-SR2000N WITH OPTION
AIT CMT-SR2000N WITH OPTION Process: analysis