Complete S-3200N SEM with Oxford INCAx-act Detector Oxford INCAx-act Detector Vintage 2009 Res...

SEM - Critical Dimension (CD) Measurement Metrology Equipment Currently Configured for: 300mm ...

SEM - Critical Dimension (CD) Measurement Metrology Equipment Date of Manufacture: 2013-01-01 ...

SEM - Critical Dimension (CD) Measurement Metrology Equipment Date of Manufacture: 2014-05-01 ...

2019 Hitachi High-Technologies Plasma Asher unit, manufactured in Japan and configured for high-c...

Process Type: Metrology & Inspection Date of Manufacture: 2001 Status: Refurbished Hitachi S-7...

Year Manufactured: 2003

Refurbished Hitachi S-4800 II. Wafer : 200mm. Vintage : 2004. Secondary electron image resolut...

Running. It’s in Working Condition but selling As Is. It is complete and HDD & Software Include...

We have this SEM in stock in Ireland, The PC is not included, Asking price as is $10K USD ex wo...

SEM - Critical Dimension (CD) Measurement Metrology Equipment Date of Manufacture: 2005-07-15 ...