Buy Equipment

Process: memory tester Condition: as is

2004 FSM 500TC Process: Thin Film Stress Measurement System Condition: as is

2007 FSM 500TC Process: Thin Film Stress Measurement System Condition: as is

Process: Prober Condition: As is

GAERTNER L115C-8 1627-AK Ellipsometer 1995.03 Condition: AS-IS Process: Ellipsometer

Novellus Gamma 2100 Condition: as is Wafer size: 8" Process: Asher

Process: wet oxidation Condition: as is Wafer size: 12"

Process: Furnace(ALD NITRIDE) Condition: initial passed Wafer size: 12"

Process: CVD Wafer size: 4" Condition: as is

Process: BCD PLOY Condition: AS-IS Wafer size: 12"

Very little used, in top condition Data sheet (in German) in attachment

KLA 6200 for sale in Refurbished condition. Optional Calibration Wafers available if required 4...