2017 Hanmi Laser Cleaning 1.0

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Used 2017 Hanmi Laser Cleaning 1.0
Description LASER CLEANING_HANMI LASER CLEANING 1.0_HLC001 Accessories 2 X Buffer and Vacuum box...

2017 Hanmi 3000 Powerfusion

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Used 2017 Hanmi 3000 Powerfusion
Hanmi Testhandler for power modules Hanmi CAM Press (T&F) Hanmi Laser Marking Tube to Tray Con...

1996 Fusion Systems Inc. GPS M202PCU

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Used 1996 Fusion Systems Inc. GPS M202PCU
2 available Fusion Gemini MCU 8" The Tool is complete and is working, full usage for its purpos...

1996 NIKON NSR-2205i12D

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Used 1996 NIKON NSR-2205i12D
Tool Status Connected Wafer Size 200 mm Fab Section Lithography Vintage 1996 Asset Descriptio...

1996 NIKON 2205i11D

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Used 1996 NIKON 2205i11D
Tool Status Running Wafers Wafer Size 200 mm Fab Section Lithography Vintage 1996 Asset Descr...

2006 KLA Surfscan SP2

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Used 2006 KLA Surfscan SP2
Wafer Defect Inspection System Wafer Size300mm Vintage May. 2006 Windows System Main S/W Waf...

2015 Bruker Scion GCMS Triple Quad Systems

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Used 2015 Bruker Scion GCMS Triple Quad Systems
GC 436 , Scion Triple quad mass spectrometer, autosampler, pc and pump included

2017 Beneq TFS 200

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Used 2017 Beneq TFS 200
ALD (Atomic Layer Deposition) Deposition Equipment Date of Manufacture: 2017-01-01 Currently C...

2009 Oxford Plasmalab 100 PECVD System

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Used Oxford Plasmalab 100 PECVD System
Advanced PECVD system for thin film deposition and etch applications Key Features: Oxford instr...

2015 FUSEI FMTM300-7HS-32P

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Used 2015 FUSEI FMTM300-7HS-32P
4 available FMTM300-7HS-32P FUSEI_MENIX MOLD PRESS Year of Manufacture2015 (x3) 2018 (x1) Cond...

2005 AMAT AKT 1600 PECVD GEN 2 & 2.5

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Used 2005 AMAT AKT 1600 PECVD GEN 2 & 2.5
AMAT AKT 1600 PECVD process iN , SiO2, i a Si, SiON and N+ a Si Process : PECVD iN,SiO2, i a S...

Leica INM20 inspection Microscope 200mm

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Used NIKON  INM20 inspection Microscope 200mm
LEICA INM20 Wafer Inspection Microscope · Bright/Darkfield Objective Lenses; Plan 5X, Plan Fluor...