The NanoSpec 6100 is a fast, reliable, low cost tabletop film thickness and mapping system that p...

Turbopumped Leak Detector Rollaround Console Configuration for Device Testing Liquid Nitrogen Co...

Film Thickness Monitor Ellipsometer

Profilometer - Date of Mfg: 4/92 - ±10 mm Scan Length - 2 to 250 µm/sec Scan Speed - 50/sec nomi...

CD SEM Measurement Tool - Wafer Size Range Minimum 100 mm Maximum 150 mm Set Size 150 mm - Reso...

Xray System XRAY Wafer Analyzer Power Requirements 240 V 2.5 A 47-63 Hz 1 Phase CE Marked YES

Overlay Metrology / CD Measurement Tool for up to 200mm Wafers - Wafer Size Range Maximum 200 m...

Overlay Metrology Tool Overlay Registration Tool - Has Been Upgraded to a Q6 CD Measurement, Si...

Overlay Metrology / CD Measurement Tool for up to 200mm Wafers

Overlay Metrology Tool

Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoload...

RECIF SPP8 Wafer Transfer for 200mm Wafers Mfg Date: 1996 Tabletop Vacuum Free Horizontal Tran...