Nikon Eclipse L200 + NWL860 TWB Microscope

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Used Nikon Eclipse L200 + NWL860 TWB Microscope
Warehoused Working Condition Vintage : Not Available. But it seems around 2015. It's complete.

2016 Delvotec G5/64000

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Used 2016 Delvotec  G5/64000
Including, 90° and 45° Bond Heads, Heated WH, Ebox. 2016 Refurbished, running condinition.

2014 Nordson Flex TRAK-2MB

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Used 2014 Nordson Flex TRAK-2MB
Plasma cleaner

2013 Nordson Flex TRAK-2MB

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Used 2014 Nordson Flex TRAK-2MB
Plasma cleaner

AMAT P-5000 Mark II MxP Poly

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Used AMAT P-5000 Mark II MxP Poly
Polysilicon Etch Etch/Ash/Clean - Plasma Processing Currently Configured for: 200mm Current Eq...

2001 Rudolph Technologies, Inc. Vanguard SpectraLASER 200XL

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Used
Film Thickness Measurement System Metrology Equipment Date of Manufacture: 2001-12-31 Currentl...

1997 Prometrix UV-1250SE

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Used 1997 Prometrix UV-1250SE
Film Thickness Measurement System Metrology Equipment Date of Manufacture: 1997-12-31 Currentl...

Signatone S-M90

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Used Signatone S-M90
Process Type: Wafer Probes Status of Equipment: De-installed Includes Signatone WL170 RF Manual...

2001 BTI BDF-41 Oxide

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Used 2001 BTI BDF-41 Oxide
Description OFEN23B Horizontal Wafer Size Range Minimum 150 mm Maximum 200 mm Set Size 200 mm ...

2001 BTI OFEN22B BTI BDF- 41 Oxide

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Used 2001 BTI OFEN22B BTI BDF- 41 Oxide
BTI BDF- 41 Oxide Description OFEN22B Horizontal Wafer Size Range Minimum 150 mm Maximum 200 m...

Brooks EEPC Transponder RS232/Ethernet

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Used Brooks  EEPC Transponder RS232/Ethernet
Brooks EEPC Transponder frequency: 13.56MHz TR5: 500mA (T) Interface: 1200 Bd - 57600 Bd Prot...

2001 BESI FICO_AMS11MR2

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Used 2001 BESI FICO_AMS11MR2
Condition Good Year of Manufacture 2001 Exterior Dimensions Width 83.465 in (212.0 cm) Depth 4...