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2004 Applied Materials NanoSEM 3D
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Applied Materials NanoSEM 3D, 300mm wafers Vintage : 2004 Process: Scanning Electron, CDSEM Mea...
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2017 AMAT Frontier
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300mm CHA-SiCoNi, CHC-Frontier
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2012 AMAT Endura
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300mm ALD TiAl / TiN
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KLA Surfscan 6420
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150 / 200 mm Refurbished
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ASML AT 1100 Twinscan
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200mm and 300mm stages
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Waftech Multi Size Wafer Sorter
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WafTech multi size wafer sorter
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Yelo Bylt Y1000 burn-in oven
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Spec in images
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Teradyne MicroFlex
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Tester 200mm
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Teradyne MicroFlex
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Tester 200mm
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Watkins Johnson WJ999
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Electroglas EG 4090 u Prober
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Prober Working condition Vintage circ 1999~2000 MS Dos system EGCommander software
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Westbond 4700E
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Very good condition and looks like new
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