KLA TENCOR ALPHA STEP IQ Surface Profiler

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The Alpha‐Step IQ Profiler is a highly sensitive, computerized surface profiler that measures roughness, undulation, and step height in a variety of applications. It features the ability to measure micro‐roughness over short distances with up to 1Å (0.1 nm) or less resolution, as well as the undulation of a sample up to 10 mm (0.4 in) long. The computer offers powerful measurement control, data storage, analysis, and networking.