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2010 Agilent 7500A ICP-MS
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Agilent7500a ICP-MS Common Features of All 7500 Series Systems • Compact benchtop design permit...
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Nikon iNexiv VMA-2520 Automated Optical Inspection Measuring System
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Automated Optical Inspection Measuring System
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2013 Sokudo RF 310 A Photoresist Coater
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12"
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Leica INS 3300 DUV
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Metrology System
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Yield Engineering Systems Dual Function YES-58D HMDS
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Yield Engineering Dual Function YES-58D HMDS and image reversal oven with Alcatel SD2010 pump and...
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Yield Engineering Systems 3TA HMDS vapor prime oven
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Interior chamber: 12"w x 13.25"d x 12"h (2) PID Temperature Controllers 25-200ºC PLD Logic Con...
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2004 Delvotek 6400DA
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1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)
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- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV...
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Electroglas 4090 u+ Probing System
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Type: Probing System Wafer Size: Equipment Configuration: - 115V - 60 Hz With: - Olympus SZ3...
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2015 Dek Horizon 03ix
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• CE mark • Hawkeyes 750 camera system • Window 10 * ASM Frame, For stencil mount adjustment ...
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2002 Malvern Mastersizer 2000
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Malvern Mastersizer 2000 with Scirocco dry powder feeder (2002) Mastersizer 2000, model APA2000 ...
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2011 Malvern Mastersizer 2000
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Mastersizer 2000 with 2000S Hydro liquid sampler .02-2000um Mastersizer 2000, model APA2000 Hyd...
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