2010 Agilent 7500A ICP-MS

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Used Agilent 7500
Agilent7500a ICP-MS Common Features of All 7500 Series Systems • Compact benchtop design permit...

2010 HITACHI S-4800 11

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Used 2010 HITACHI S-4800 11
- Is it type 1 or type 2? Type 2 - Type of detector? Horiba EMAX x-act - Is sample sputtering sys...

2000 AMAT Centura

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Used 2000 AMAT Centura
Metal Etch. No loadports included. Tool Status Running Wafers Wafer Size 200 mm Fab Section Et...

2003 TEL P12XL

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Used 2003 TEL P12XL
TEL, P12XL, 300mm Tool Status Connected Wafer Size 300 mm Fab Section Test Asset Description ...

2005 ESI 9350

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Used 2005 ESI 9350
It’s warehoused now in wrapped. It was in working condition before de-installing. Vintage : 200...

2017 KLA-Tencor Surfscan SP 3 Wafer Inspection System

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Used KLA-Tencor Surfscan SP 3 Wafer Inspection System
Good working condition Wafer Inspection System

2007 F&K Delvotek G 5 Wire Bonder

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Used 2007 F&K Delvotek G 5 Wire Bonder
- 50/60 Hz - Nominal Voltage: 100-120 / 200-240V - Nominal Power: 3.2 kVA - CPU is non functional...

2007 F&K Delvotek G 5 Wire Bonder

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Used 2007 F&K Delvotek G 5 Wire Bonder
- 50/60 Hz - Nominal Voltage: 100-120 / 200-240V - Nominal Power: 3.2 kVA - CPU is non functional...

2009 F&K Delvotek G 5 Wire Bonder

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Used 2009 F&K Delvotek G 5 Wire Bonder
- 50/60 Hz - Nominal Voltage: 100-120 / 200-240V - Nominal Power: 0.5 kVA 2009 Vintage

1997 HITACHI S 8840 CD-SEM

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Used 1997 HITACHI S 8840 CD-SEM
1997 Vintage

1996 Mattson Technology AST 2800

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Used Mattson Technology AST 2800
Description RTP Wafer Size 200 mm Fab Section Thin Film Asset Description AST SUPER HEAT SYSTE...

2010 Fischerscope X-ray XDV-u

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Used 2010 Fischerscope X-ray XDV-u
Wafer Size NA Fab Section R&D Vintage 2010 Asset Description XRF02: FISCHERSCOPE® X-ray XDV®-u...