2018 Cyberscan CT350T Dual non-contact double-sided optical profilometer ct 350

2 Tools

- DUAL NON-CONTACT MEASUREMENT SYSTEM

- 3D MAPPING OF THICKNESS,BOW, WARPAGE AND ROUHGNESS

- USER FRIENDLY CONCEPT

- SOPHISTICATED ANALYSIS AND AUTOMATION SOFTWARE

Tools are still running in production. Available from May/June 2019

Inspection possible!

The tools are pretty new and rarely used. Vintage 2018 and 2015 

The CT 350T was originally designed for measuring

thickness of substrates and wafers. It provides

accurate measurements independent of material

and surface properties. There is no limitation on the

minimum thickness, even measurements of samples

with a thickness of only a few microns can easily be

taken.