Hitachi SU8040 Scanning Electron Microscope, is a high-quality SEM used in various industries, re...

The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-300...

Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.3nm (1kV, WD=1.5mm, Deceleration mo...

We have this SEM in stock in Ireland, The PC is not included, Asking price as is $10K USD ex wo...

Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is ...

- Ultra high resolution

Wafer size : 12 inch Resolution : ≦2nm Static measurement repeatability(3σ) : 0.6nm Dynamic me...

Process Type: FA SEMs/TEMs/Dual Beams Specifications: Secondary Electron image resolution: 0.4...

Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N//A Date of Manufacture: 2008 Equipment Inf...

Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Status of Equipment: Refurbished Configu...

Status of Equipment: Crated Specification: Secondary electron image resolution: 2.1nm at 1kV 1...