Rudolph Technologies, Inc. Waferscan 8000
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Macro-Defect Metrology Equipment Currently Configured for: 200mm
2001 Rudolph Technologies, Inc. Vanguard SpectraLASER 200XL
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Film Thickness Measurement System
Metrology Equipment
Date of Manufacture: 2001-12-31
Currentl...
2007 Rudolph Technologies, Inc. S3000A
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Vintage: 2007
Wafer size: 300mm
Install Type: Stand-Alone
Can Produce Wafers As-Is: Yes
CE Ma...