Plasmatherm Restanten

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Used Plasmatherm Restanten
Dry Etch

Perklin Elmer 300HT Microalign

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Used Perklin Elmer 300HT Microalign
Lithography

Olympus BHMJL

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Used Olympus BHMJL
Microscope

Olympus BHMJL

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Used Olympus BHMJL
Microscope

Novellus Concept Three Vector

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Used Novellus Concept Three Vector

Novellus Concept Three Vector

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Used Novellus Concept Three Vector

Nanometrics Sipher

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Used Nanometrics Sipher
EPI SLIP AND DEFECT

Montair Wafer etch

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Used Montair Wafer etch
General

Met One DE712AF-5

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Used Met One DE712AF-5
Surface Particle Counter

Mattson Ast3000

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Used Mattson Ast3000

Leitz INM100+INS10

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Used Leitz INM100+INS10
Metrology

Leica WILD M420

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Used Leica WILD M420
Microscope