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2010 SEMILAB WT-2000D
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Process: life time measurement Condition: complete
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KLA/ MicroSense UMA-C200-STR Thin Film Stress Measurement System
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200mm As-is KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: -...
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BAL-TEC (Gartan) SCD005
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Process: sputter coater Condition: working Wafer size: multi
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2004 Semitool Sirius System
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- Model: Sirius HydrOzone - Wafer Size: 150mm & 200mm wafer capable - Process: DI water/ozone ...
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Toray Engineering Inspectra 1000 sx-III
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Category: Wafer Inspection & Metrology
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AITCO CMT SR2000N 4 Pt Probe
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AITCO CMT-SR2000N 4 Point Probe consisting of: - Vintage: Approximately 2019 - Up to 8" capable...
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West-Bond 4546E-79C Semi-Auto Convertible 90° deep access Wedge Wire Bonder
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Full setup with Camera, Monitor, Heated work holder, microscope, light source for microscope. Se...
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Nikon NSR-SF100
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Operational Status: Installed / Idle OEM Model Description The NIKON NSR SF100 is a Steppers a...
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2019 AMAT Centura II Metal Etch System
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APPLIED MATERIALS AMAT CENTURA II consisting of: - 2 DPS / DTM Chambers - Configured for 200mm ...
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2003 Nikon NSR SF 100 Stepper
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Nikon NSR SF 100 Stepper 8" - 6" reticle - Resolution: 0.4um or less - N.A.: 0.5 - Exposed li...
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2009 ASM A412 Furnace
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Retired from a tire 1 fab This tool was under working conditions before de-installed. -No missi...
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Hitachi Hightech PD3000
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Metrology 8" Frame Mask visual inspection Offline
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