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APPLIED MATERIALS / AMAT SEM VISION CX 200mm
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AUTO DEFECT REVIEW SEM/EDX
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APPLIED MATERIALS / AMAT MIRRA TRAK 200mm
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Applied Materials Mirra Trak CMP Tool Remanufactured and configured for 200mm wafers Includes: - ...
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NanoSpec 9010FLASH-XLS Integrated Metrology System
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NanoSpec 9010FLASH-XLS Integrated Metrology System NanoSpec 9010FLASH-XLS Integrated Metrology Sy...
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Mitutoyo Laser Scan Micrometer MITUTOYO LSM-6100 Code 544-070
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Mitutoyo Laser Scan Micrometer MITUTOYO LSM-6100 Code 544-070
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THERMO FI LTD ELEMENT 2 300mm
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ICPMS
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RUDOLPH METAPULSE 300 300mm
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FILM THICKNESS
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RUDOLPH 3DI 8000 300mm
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C4 BUMP INSPECTION
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Rudolph FE V11D Focus Ellipsometer
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Sold in Operational Condition.
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IMS LVIS-III Visual Inspector
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IMS LVIS-III Visual Inspector
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OAI Hybralign 400
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Mask Aligner, for up ro 200mm Wafers
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N.E.A.T. 330UP
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Programmable Controller, for 200mm XY Stage
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KLA-TENCOR CRS-1010
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Offline Review Station, forup to 200mm Wafers
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