BIORAD QS-1200 Automated FT-IR Spectrometer

Sold Refurbished and fully operational

 Non-Destructive Measurement of Epitaxial Silicon Films

 PIKE TECHNOLOGIES Mapp300 Automatic Scanning Stage

 Manual Loading for up to 300mm Wafers

 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping

 FTS-575C Optical Bench

 Dynamically Tuned Beam Splitter

 New KBr Beam Splitter

 Dual Frequency IR Source

 Upgraded HeNe Laser

 System Control PC with Windows XP, 320G HD & 1G RAM

 Win-IR Pro (Rev. 2.51) Application Software

 QS-500 Epi (Rev. 1.31) Application Software

 Microsoft Access Database Application

 System Software, Applications Software & Site Preparation Manuals Included