Nanometrics Nanospec AFT2100 Film Thickness Measurement System

film thickness from 100A to 50 microns

Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator

spot size 6.5um to 65um

wavelength range 400-800nm

16 standard films tests

special films can be measured by entering the refractive index

Refurbished by Nanometrics factory trained technicians March 2019