JEOL JSM-6400F SEM Scanning Electron Microscope Column Assembly Working Surplus

JEOL JSM-6400F SEM Scanning Electron Microscope Column Assembly Working Surplus

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Description

  • Model No: JSM-6400F Column
  • Made in Japan

Installed Components

  • Part No: BEI Preamplifier
  • Part No: Noise Canceller Preamp
  • Edwards Part No: D14644000, AIM-SL-NW25
  • Granville-Phillips Part No: 75 Convectron

This JEOL JSM-6400F SEM Scanning Electron Microscope Column Assembly is used working surplus. The column appears complete but may be missing accessories (see photos). More photos are available upon request. The unit will ship on the original base. The physical condition is good, but there are signs of previous use and handling.

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Specifications

ManufacturerJEOL
ModelJSM-6400F SEM Scanning Electron Microscope Column Assembly Working Surplus
ConditionUsed
Stock NumberGOD2308201975139726