Hitachi S-4700-I w/EDX

Status of Equipment: Crated

Specification:

Secondary electron image resolution: 2.1nm at 1kV

1.5nm at 15kV and WD = 12mm or X-ray analysis position

Magnification: LM mode: 20 ~ 2,000X

HM mode: 100 ~ 800,000X

Specimen Stage:

Type I: X: 0 ~ 25mm; Y: 0 ~ 25mm, Z: 1.5 ~ 26.5mm; T: -5 ~ +45 deg, R: 360 deg. 100 loadlock

2 axis motorization, mouse control

Operating System: Windows XP

Vacuum: Turbo Pump

Water Chiller: Haskris water cooled

Misc: Manuals and backup software discs