2012 FEI CLM+
2012 FEI CLM+
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Description
Type : FIB (Focused ION Beam)
Process : Metrology (Defect Review)
Function : SEM, ION Milling
Vintage : 2012
Wafer size : 12"
Specifications
| Manufacturer | FEI |
| Model | CLM+ |
| Year | 2012 |
| Condition | Used |
| Stock Number | BM2733 |