2004 TEL P12XLn

TEL, P12XLn, 300mm

Tool Status Disconnected 

Wafer Size 300 mm 

Fab Section Test 

Asset Description PROMOS_1158/082 FA Eqt_MAC0450_TEL Auto Probing Machine Model

Software Version NA

CIM NA

Process Wafer Testing

Main System TEL P12 Prober 1

Handler System NA

Factory Interface Open Cassette 1

Missing/ faulty parts/ accessories list

HDD Board 1

Prober LCD screen 1

VIP3A 1