1997 Jeol JWS 7515 Scanning Electron Microscope (SEM)

Condition: “As is” 
Date of manufacture: 1997

​Wafer size 150-200mm

SEM Field emission electron gun

Resolution: 8 nm

Magnification: 100x to 200,000x

Accelerating voltage: up to 12 kV

4-Axis goniometer stage.