1997 Jeol JWS 7515 Scanning Electron Microscope (SEM)
1997 Jeol JWS 7515 Scanning Electron Microscope (SEM)
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Description
Condition: “As is”
Date of manufacture: 1997
Wafer size 150-200mm
SEM Field emission electron gun
Resolution: 8 nm
Magnification: 100x to 200,000x
Accelerating voltage: up to 12 kV
4-Axis goniometer stage.
Specifications
| Manufacturer | Jeol |
| Model | JWS 7515 Scanning Electron Microscope (SEM) |
| Year | 1997 |
| Condition | Used |
| Stock Number | BM3608 |