2003 HITACHI S-4500 , Scanning electron microscope

Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustment in X, Y, Z directions, BSE detector Centaurus, EDX detector Bruker X-Flash 5030,incl. accessories, consisting of: 1 PC with Bruker Esprit 2.2 software for image processing, 1 24 inch monitor, 1 signal processing unit (Bruker) .1 BSE detector control, 2 high-voltage devices, 2 oil rotary pumps, 1 Van der Heijden heat exchanger and various sample holders, tiltable by 45°