Tencor P-1 Long Scan Profiler

Tencor P-1 Long Scan Profiler

The Tencor P-1 Long Scan Profiler is a

computerized, high-sensitivity surface profiler that

measures roughness, waviness, and step height in

a variety of applications.  It features the ability to

measure micro-roughness with 1 Å resolution over

short distances as well as waviness over a full,

210-mm (8.2-in) scan.  The built-in PC/AT computing

power offers precise, automatic measurement

capability, data storage, and data analysis.  The

Tencor P-1 can profile a variety of materials,

including magnetic disks, semiconductor wafers,

precision-machined and polished surfaces,

ceramics for micro-electronics, glass for flat panel

displays and optical surfaces.