1997 Hitachi S-7800
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Description
Process Type: Metrology & Inspection
Wafer Size: 200mm
Date of Manufacture: Aug 1997
Status of Equipment: Refurbished
Hitachi S-7800, includes dry EDX detector and system. Configured for 8 inch wafers, however, can be reconfigured for smaller wafer sizes as well.
Specifications
| Manufacturer | Hitachi |
| Model | S-7800 |
| Year | 1997 |
| Condition | Used |
| Stock Number | BM4524 |