Semiprobe Diced wafer Inspection system

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Description

Semiprobe Diced wafer Inspection system with wafer mapping software

Semiprobe wafer prober mounted on Newport table

Inspects diced wafers mounted on film frames

Wafer stage with motorized X,Y and theta

Motic PSM-1000 microscope with 5x and 20x objectives

video port with camera and monitor

Motic fiber optic light source

2 inkers for die marking

PC with Semiprobe software for wafer mapping and defect marking

Chuck configured for 150mm wafer frames with alignment pins

Newport vibration isolation table with 4" breadboard

Specifications

ManufacturerSemiprobe
ModelDiced wafer Inspection system
ConditionUsed
Stock NumberEM909