KLA- Tencor SP1-TBI Defect Inspection System

KLA-Tencor SP1-TBI Wafer Defect Inspection System | 200mm | AS-IS

Description

KLA-Tencor SP1-TBI wafer defect inspection system configured for 200mm wafers. Originally manufactured in April 2000 and re-manufactured in November 2017. System is equipped with open cassette loading and dual cassette configuration. Unit is complete with no missing parts but currently experiences initialization errors and is offered strictly AS-IS / WHERE-IS.