Featured
2002 Rudolph MetaPulse 200mm
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Description
- MP200 double path tool
- non copper tool; double path tool delay stage;
- 6 inch c...
Featured
2001 Brooks MTX2000/2 300mm Wafer Sorter
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STRIPPED FOR PARTS. ASK FOR THE LIST OF PARTS AVAILABLE
Condition: Very Good
Vintage 2001
Conf...
2017 KLA Filmetrics F20-UV Thin Film Analyser
$29,000 (USD)
Filmetrics F20-UV Thin Film Thickness Measurement System – P/N 205-0673
Manufacturer: Filmetrics...
2009 KLA Tencor SP1 DLS Particle Defect System
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KLA Surfscan SP 1 DLS Particle Defect System, 8"
- Missing parts
Analog boards x2
DC Distribut...
2021 Nanotronics Nspec high-resolution optical inspection and metrology system
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Spec in images
2008 Malvern Panalytical PW-2830 XRF Wafer Analyzer
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4, 6 & 8"
capable XRF X-Ray Fluorescence
( and not a XRD X-Ray Diffraction. )
Zero drift elect...
2017 Rudolph F30 AOI
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2 sets of Rudolph F30 AOI systems each equipped with an Explorer SWS Wafer Handling Systems
Exce...
2004 Hitachi S9220 CD-SEM
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Professionally Deinstalled,
skidded in storage
Working condition prior to deinstall
Came from ...
2006 KLA eS32 e-beam wafer inspection 200mm
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KLA eS32 E-beam Wafer Inspection 200mm
eS32 is a top-of-the-line mask and wafer inspection equip...
Zeiss 1540 EsB Dual Beam FIB-SEM
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Zeiss 1540 EsB Dual Beam FIB-SEM
- EDX is included
- 10mm EDAX detector
- Known issue with Ion...
Zeiss Axiotron
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Zeiss Axiotron Microscope
200 mm Wafer Configuration
10X Eyepieces
5X, 10X, 20X, 50X, 100X Obj...