Semiconductor Fabrication - Metrology for sale at Tara Semiconducto...

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Used Rudolph MetaPulse 200mm

Description - MP200 double path tool - non copper tool; double path tool delay stage; - 6 inch c...

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Used 2001 Brooks MTX2000/2

STRIPPED FOR PARTS. ASK FOR THE LIST OF PARTS AVAILABLE Condition: Very Good Vintage 2001 Conf...

Used 1996 KLA-Tencor RS-75TCA OmniMap

Complete No Missing

Used 2002 Hitachi S-8840 CD SEM

200mm Pumps and Chillers may not be included

Used 2009 KLA Tencor SP1 DLS

KLA Surfscan SP 1 DLS Particle Defect System, 8" - Missing parts Analog boards x2 DC Distribut...

Used Hitachi S-8820 CD-SEM

Warehoused. It was in working condition. It’s complete with HDD and Software included. Wafer :...

Used

Spec in images

Used Malvern Panalytical PW-2830 XRF Wafer Analyzer

4, 6 & 8" capable XRF X-Ray Fluorescence ( and not a XRD X-Ray Diffraction. ) Zero drift elect...

Used 2017 Rudolph F30 AOI

2 sets of Rudolph F30 AOI systems each equipped with an Explorer SWS Wafer Handling Systems Exce...

Used 2004 Hitachi S9220 CD-SEM

Professionally Deinstalled, skidded in storage Working condition prior to deinstall Came from ...

Used 2006 KLA eS32 e-beam wafer inspection 200mm

KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equip...

Used Zeiss 1540 EsB Dual Beam FIB-SEM

Zeiss 1540 EsB Dual Beam FIB-SEM - EDX is included - 10mm EDAX detector - Known issue with Ion...