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2012 Four Dimensions CVMAP 3092-A
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Minimum 150 mm Maximum 300 mm Set Size 200 mm The CVMAP 3092A uses a mercury probe, which is i...
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2006 Rudolph MP200 Contactless Metal Thickness Measurement
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Description - MP200 double path tool - non copper tool; double path tool delay stage; - 6 inch c...
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2001 Brooks MTX2000/2 300mm Wafer Sorter
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Condition: Very Good Vintage 2001 Configuration: 12" Wafer sorter with: 2x Fixload V6 Multip...
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KLA Tencor ASET F5X Film thickness Measurement 200mm
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Currently Under KLA Service Contract. WAFER SIZE: 200mm
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2004 Hitachi S9220 CD-SEM
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fab out july 24th 2023 Offers must be submitted by the 16th of June Buyer is responsible for de...
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FEI QUANTA 200 3D DualBeam FIB
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The FEI Quanta 200 3D Dual Beam SEM is equipped with a Ga Ion Source. Capable of surface imaging...
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KLA Archer 200 Overlay Metology
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WAFER SIZE: 150mm-300mm, Configured for 300mm
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2006 KLA eS32 e-beam wafer inspection 200mm
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KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equip...
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2007 JEOL JWS-2000 WAFER INSPECTION SYSTEM
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WAFER SIZE: 200mm
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AIT CMT-SR2000N WITH OPTION
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AIT CMT-SR2000N WITH OPTION Process: analysis
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AIT CMT-SR2000N
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AIT CMT-SR2000N Process: analysis
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2006 Hitachi S-9260 CD-SEM
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as-is Wafer Size: 200mm
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