1996 Thermawave TP500

1996 Thermawave TP500
Thermawave TP500 for sale Contact us for more info

2003 Leica INS 3300 DUV

2003 Leica  INS 3300 DUV
Leica INS3300 is the most advanced solution in the production control of 200 mm and 300 mm wafers...

Nanometrics Nanospec 9300Is Advanced Film Analysis System

Nanometrics Nanospec 9300Is Advanced Film Analysis System
Standard operating system working condition no missing parts

Leica INS3000 2K

Leica  INS3000 2K
Leica INS3000 2K Used Leica Review & inspection station refurbished Condition Review & inspecti...

KLA-Tencor Spectra-Shape 8660

KLA-Tencor Spectra-Shape 8660
KLA-Tencor Spectra-Shape 8660 WAFER SIZE: 300

KLA-Tencor ICOS T830

KLA-Tencor ICOS T830
KLA-Tencor ICOS T830 Optical Review System WAFER SIZE: 300MM

2007 Hitachi S-4800

2007 Hitachi S-4800
2007 Hitachi S-4800 SEM with EDX

Hitachi WA200

Hitachi WA200
Hitachi WA200 FAB WAFER SIZE: 8"

Veeco D9000

Veeco D9000
Veeco D9000 fab WAFER SIZE: 8"

Zeiss Axiotron

Zeiss Axiotron
Zeiss Axiotron Microscope 200 mm Wafer Configuration 10X Eyepieces 5X, 10X, 20X, 50X, 100X Obj...

Waferworx 53-450000-001

Waferworx 53-450000-001
Waferworx 53-450000-001 3D Inspection 200mm and has Olympus Mdl MX80-F Microscope WAFER SIZE: 200mm

1994 Nanometrics 4000

1994 Nanometrics  4000
Nanometrics 4000 Film Thickness Measurement System Model Number 7200-1821 Rev B 150 mm Wafer Co...