Four Dimensions 280SI Automatic Four Point Probe

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Used Four Dimensions 280SI Automatic Four Point Probe
- Features: - Automated Sheet Resistivity Meter - 1 mOhm / square to 800 kOhm / square - extended...

Karl Suss MA 200 E Gen 3 Refurbished

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Refurbished Karl Suss MA 200 CC
8" Mask Aligner TSA, cassette to cassette, Completely refurbished, everything renewed with orig...

KLA Archer 200 Overlay Metology

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Used KLA Archer 200 Overlay Metology
WAFER SIZE: 150mm-300mm, Configured for 300mm

KLA Alpha Step 500 Profiler

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Used KLA Alpha Step 500 Profiler
KLA-TENCOR ALPHA-STEP 500 PROFILER consisting of: - Alpha-Step 500 Mainframe - Up to 6"/150mm W...

1999 KLA TENCOR ASET-F5 Thin Film Measurement System

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Used 1999 KLA TENCOR ASET-F5
KLA-Tencor ASET-F5 Thin Film Measurement System configured for 200mm wafers. The tool is currentl...

2006 KLA eS32 e-beam wafer inspection 200mm

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Used 2006 KLA eS32 e-beam wafer inspection 200mm
KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equip...

2007 JEOL JWS-2000 WAFER INSPECTION SYSTEM

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Used 2007 JEOL JWS-2000 WAFER INSPECTION SYSTEM
WAFER SIZE: 200mm

KLA Tencor Omnimap RS55/TCA

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Used KLA Tencor Omnimap RS55/TCA

AIT CMT-SR2000N WITH OPTION

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Used AIT CMT-SR2000N WITH OPTION
AIT CMT-SR2000N WITH OPTION Process: analysis

AIT CMT-SR2000N

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Used AIT	 CMT-SR2000N
AIT CMT-SR2000N Process: analysis

2006 Hitachi S-9260 CD-SEM

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Used 2006 Hitachi S-9260 CD-SEM
as-is Wafer Size: 200mm

FEI QUANTA 200 3D DualBeam FIB

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Used QUANTA  200 3D DualBeam
The FEI Quanta 200 3D Dual Beam SEM is equipped with a Ga Ion Source. Capable of surface imaging...