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Four Dimensions 280SI Automatic Four Point Probe
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- Features: - Automated Sheet Resistivity Meter - 1 mOhm / square to 800 kOhm / square - extended...
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Karl Suss MA 200 E Gen 3 Refurbished
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8" Mask Aligner TSA, cassette to cassette, Completely refurbished, everything renewed with orig...
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KLA Archer 200 Overlay Metology
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WAFER SIZE: 150mm-300mm, Configured for 300mm
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KLA Alpha Step 500 Profiler
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KLA-TENCOR ALPHA-STEP 500 PROFILER consisting of: - Alpha-Step 500 Mainframe - Up to 6"/150mm W...
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1999 KLA TENCOR ASET-F5 Thin Film Measurement System
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KLA-Tencor ASET-F5 Thin Film Measurement System configured for 200mm wafers. The tool is currentl...
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2006 KLA eS32 e-beam wafer inspection 200mm
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KLA eS32 E-beam Wafer Inspection 200mm eS32 is a top-of-the-line mask and wafer inspection equip...
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2007 JEOL JWS-2000 WAFER INSPECTION SYSTEM
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WAFER SIZE: 200mm
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KLA Tencor Omnimap RS55/TCA
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AIT CMT-SR2000N WITH OPTION
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AIT CMT-SR2000N WITH OPTION Process: analysis
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AIT CMT-SR2000N
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AIT CMT-SR2000N Process: analysis
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2006 Hitachi S-9260 CD-SEM
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as-is Wafer Size: 200mm
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FEI QUANTA 200 3D DualBeam FIB
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The FEI Quanta 200 3D Dual Beam SEM is equipped with a Ga Ion Source. Capable of surface imaging...
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