Tencor M-Gage 300 Non-Contact Resistivity Monitor (allwin)

$10,000 (USD)
Used Tencor M-Gage 300 by Allwin Corp
Powers on, cycles through the menus Non-Contact Resistivity Monitor Refurbished by Allwin Used...

Nikon Optiphot-200 BF/DF Inspection Microscope

$5,000 as is, ex works
Used Nikon Optiphot-200
Nikon Optiphot 200 Inspection Microscope - Nikon 'Optiphot 200' Microscope with video takeoff, -...

Four Dimensions 280SI Automatic Four Point Probe

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Used Four Dimensions 280SI Automatic Four Point Probe
- Features: - Automated Sheet Resistivity Meter - 1 mOhm / square to 800 kOhm / square - extended...

FEI QUANTA 200 3D DualBeam FIB

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Used QUANTA  200 3D DualBeam
The FEI Quanta 200 3D Dual Beam SEM is equipped with a Ga Ion Source. Capable of surface imaging...

Hitachi S-4700 II SEM

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Used Hitachi S-4700 II SEM
S-4700 II is now crated. The pictures were taken just before crating. WAFER SIZE: 150mm

2006 KLA TENCOR ES32

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Used 2006 KLA TENCOR ES32
as is where is in fab running buyer responsible for deinstall, rigging and crating

2005 KLA TENCOR eS32

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Used KLA ES 32
Wafer Mask Inspection Parts Machine KLA ES32 (1) - Stage, electron source, feed throughs includ...

Nikon MM-40 Measuring Microscope XYZ 3D

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Used Nikon MM-40 Measuring Microscope
Nikon XYZ 3D Measuring Microscope MM-40 Serial : 2103333 Nikon Stage 2x2 S/N : 2002474 Eyepiece...

2013 Accretech/TSK UF3000

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Used 2013 Accretech/TSK UF3000
Wafer size: 300mm Asset HDD not included Tool is operating in the clean room. ‘Equipment is lo...

2004 EVG 520 Manual wafer load substrate bonder

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Used
-Tooling for 6" Wafer inclusive Bond Chuck and Pressure Insert -Capable of fusion compression bo...

KLA TENCOR ARCHER 500

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Used KLA TENCOR   ARCHER 500
This Archer 500 is with water damage, but the load port is ok Suitable for parts harvesting only

Hitachi S-3000N SEM

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Used Hitachi S-3000N SEM
Hitachi S-3000N scanning electron microscope is a PC controlled variable pressure SEM with the ab...