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2001 Hitachi WA200
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Hitachi WA200 FAB SMIFF interface Wide area scanning probe microscope WAFER SIZE: 8"
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KLA-Tencor Spectra-Shape 8660
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KLA-Tencor Spectra-Shape 8660 Semiconductor Fabrication Metrology Equipment CD Measurement System WAFER S...
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2001 Hitachi S-4700 II SEM
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WAFER SIZE: 150mm
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KLA-Tencor 6200
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KLA 6200 for sale in Refurbished condition. Optional Calibration Wafers available if required 4...
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KLA TENCOR PROMETRIX UV-1050
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Hitachi S-4700 II SEM
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S-4700 II is now crated. The pictures were taken just before crating. WAFER SIZE: 150mm
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2006 KLA TENCOR ES32
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as is where is in fab running buyer responsible for deinstall, rigging and crating
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2005 KLA TENCOR eS32
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Wafer Mask Inspection Parts Machine KLA ES32 (1) - Stage, electron source, feed throughs includ...
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Micromanipulator 6" Prober Mitutoyo Microscope Probe Station with Laser Cutter
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This machine is fully refurbished with new belts, new 6 inch chuck, chuck ground, vacuum are rede...
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Alessi REL-3200 Probe Station
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ALESSI REL 3200 PROBE STATION WITH 4" CHUCK AND 4X4" TRAVEL B&L MICROZOOM OPTICS WITH 2 OBJECTI...
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Veeco Dektak 3030 Auto II PROFILOMETER
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Manufacturer Veeco Model Dektak 3030 Auto II Description Profilometer Controller Type Micropro...
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Veeco Dimension X3D 340 AFM
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Complete Unit Model:340
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