Rudolph FE-VIID Ellipsometer

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Used Rudolph FE-VIID Ellipsometer

Hewlett Packard 4194A Impedance Gain-Phase Analyzer

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Refurbished Hewlett Packard  4194A Impedance Gain-Phase Analyzer
Hewlett Packard 4194A Impedance Gain-Phase Analyzer Fully refurbished and calibrated See PDF be...

Hitachi

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Used Hitachi

2001 Hitachi WA200

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Used 2001 Hitachi WA200
Hitachi WA200 FAB SMIFF interface Wide area scanning probe microscope WAFER SIZE: 8"

KLA-Tencor Spectra-Shape 8660

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Used KLA-Tencor Spectra-Shape 8660
KLA-Tencor Spectra-Shape 8660 Semiconductor Fabrication Metrology Equipment CD Measurement System WAFER S...

2001 Hitachi S-4700 II SEM

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Used 2001 Hitachi S-4700 II SEM
WAFER SIZE: 150mm

KLA-Tencor 6200

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Refurbished KLA-Tencor  6200
KLA 6200 for sale in Refurbished condition. Optional Calibration Wafers available if required 4...

KLA TENCOR PROMETRIX UV-1050

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Used KLA TENCOR  PROMETRIX UV-1050

Hitachi S-4700 II SEM

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Used Hitachi S-4700 II SEM
S-4700 II is now crated. The pictures were taken just before crating. WAFER SIZE: 150mm

2006 KLA TENCOR ES32

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Used 2006 KLA TENCOR ES32
as is where is in fab running buyer responsible for deinstall, rigging and crating

2005 KLA TENCOR eS32

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Used KLA ES 32
Wafer Mask Inspection Parts Machine KLA ES32 (1) - Stage, electron source, feed throughs includ...

Micromanipulator 6" Prober Mitutoyo Microscope Probe Station with Laser Cutter

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Used Micromanipulator  6" Prober Mitutoyo Microscope Probe Station with Laser Cutter
This machine is fully refurbished with new belts, new 6 inch chuck, chuck ground, vacuum are rede...