1994 Nanometrics 4000
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Nanometrics 4000 Film Thickness Measurement System
Model Number 7200-1821 Rev B
150 mm Wafer Co...
2011 RUDOLPH MetaPulse-III 300XCu
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2011 RUDOLPH MetaPulse-III 300XCu Metal Thickness WAFER SIZE: 12
2003 Leica INS 3300 DUV
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Leica INS3300 is the most advanced solution in the production control of 200 mm and 300 mm wafers...
REVCO ULT1790-9-D31 Cryogenic Freezer
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Cryogenic Freezer - -40C to -86C - 6.8 Cu.Ft. - Chest Type
REDDISH ELECTRONICS SM500 CXE reflow oven
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Batch Forced Convection Reflow Oven
- Maximum Temperature 300 ºC (572 ºF, 573 ºK)
- Other Inform...
Nanometrics Nanospec 6100
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The NanoSpec 6100 is a fast, reliable, low cost tabletop film thickness and mapping system that p...
VEECO MS-35T Leak Detector
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Turbopumped Leak Detector
Rollaround Console Configuration for Device Testing Liquid Nitrogen Co...
SAGAX Isoscope 125 Film Thickness Monitor
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Film Thickness Monitor Ellipsometer
KLA-TENCOR AlphaStep 300 Profilometer
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Profilometer
- Date of Mfg: 4/92
- ±10 mm Scan Length
- 2 to 250 µm/sec Scan Speed
- 50/sec nomi...









