HITACHI S-3400N Scanning Electron Microscope

The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily and/or non-conductive samples without metal coating or other complicated specimen preparation techniques. The hardware and software functions have been developed after listening to our user's requests for better imaging, larger sample sizes, analytical capabilities, higher throughput and ease to use. Better electron optics, larger specimen chamber, faster, cleaner evacuation system and fully automated software are just a few of the new features of the S-3400N. Due to a newly designed TMP evacuation system, no cooling water is necessary. It takes less than 100 seconds to exchange a specimen and 6 minutes to reach ready status from a cold start. It requires only 2.0 kVA for the power supply. The S-3400N will be a new world standard in the middle class Variable Pressure SEM.

Deben Stage Controller.