2004 AMAT AFM-2 (METV44-1)

Atomic Force Microscope (AFM)

An Atomic Force Microscope (AFM) measures topography, feature size, defects, and properties of solid surfaces. The Dimension X AFM provides depth metrology solutions.

Wafer Size Range   Minimum 200 mm  Maximum 300 mm  Set Size 300 mm

Power Requirements    6.0 A

Year of Manufacture 2004

Condition Very Good