NIKON Eclipse L300ND 300mm Wafer Inspection Microscope with reflected and transmitted light

300mm inspection microscope for reflected and transmitted light inspection

Nikon stage with 12" x 14" XY travel and glass insert

brightfield, darkfield illuminator with (2) 12v/50W halogen lamphouse

tilt viewing head with camera port and CFUW 10x/25 eyepieces

5/10/20/50 LU Plan BD objectives

Optional: DIC module, analyzer, and rotating polarizer for Nomarski inspection