2011 AMAT SEMVISION G4

2011 AMAT SEMVISION G4

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Description

Used Applied Materials AMAT SemVision G4 wafer metrology system (year 2011), designed for high-precision optical CD and overlay measurement on 200/300 mm wafers, featuring automated wafer handling, high-throughput non-contact inspection, and cleanroom-compatible configuration for advanced semiconductor process control.


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Specifications

ManufacturerAMAT
ModelSEMVISION G4
Year2011
ConditionUsed
Stock NumberBM6533