2011 AMAT SEMVISION G4
2011 AMAT SEMVISION G4
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Description
Used Applied Materials AMAT SemVision G4 wafer metrology system (year 2011), designed for high-precision optical CD and overlay measurement on 200/300 mm wafers, featuring automated wafer handling, high-throughput non-contact inspection, and cleanroom-compatible configuration for advanced semiconductor process control.
Specifications
| Manufacturer | AMAT |
| Model | SEMVISION G4 |
| Year | 2011 |
| Condition | Used |
| Stock Number | BM6533 |