NIKON Eclipse L200 inspection microscope with reflected light for wafer inspection

NIKON Eclipse L200 inspection microscope with reflected light for wafer inspection

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Description

Reflected light observation with brightfield and darkfield

5x/10x/20x/50x LU Plan BD objectives

Trinocular viewing head with 10x eyepieces and camera port

C Mount adaptor

Nikon 8x8 XY stage with pistol grip

The following Options: are subject to availability

Nomarski includes DIC module, polarizer, analyzer

Z axis digital display

Transmitted light

Motorized stage

Tilt viewing head

2.5x, 100x objectives

Camera

Specifications

ManufacturerNIKON
ModelEclipse L200 inspection microscope with reflected light for wafer inspection
ConditionUsed
Stock NumberBM6679