NIKON Eclipse L200 inspection microscope with reflected light for wafer inspection

NIKON Eclipse L200 inspection microscope with reflected light for wafer inspection
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Description
Reflected light observation with brightfield and darkfield
5x/10x/20x/50x LU Plan BD objectives
Trinocular viewing head with 10x eyepieces and camera port
C Mount adaptor
Nikon 8x8 XY stage with pistol grip
The following Options: are subject to availability
Nomarski includes DIC module, polarizer, analyzer
Z axis digital display
Transmitted light
Motorized stage
Tilt viewing head
2.5x, 100x objectives
Camera
Specifications
| Manufacturer | NIKON |
| Model | Eclipse L200 inspection microscope with reflected light for wafer inspection |
| Condition | Used |
| Stock Number | BM6679 |



