2003 ASML AT1250 DUV193nm

Equipment according the age in good in good shape, however only one wafer stage is currently working 

2003: "ASML's new generation TWINSCAN system patterns for 65 nm node"

Equipment inspection virtual or physical possible

Wafer Size Range   Minimum 200 mm  Maximum 200 mm

Condition Fair

Year of Manufacture 2003

CE Marked YES

Exterior Dimensions   Height 122.000  in  (309.9 cm)

Weight 41,557  lb  (18,850 kg)