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HITACHI SU-70
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Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is ...
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1998 Hitachi S 5000 Field Emission Scanning Electron Microscope (FE-SEM)
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- Ultra high resolution
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2004 HITACHI s-9380 CD-SEM
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Wafer size : 12 inch Resolution : ≦2nm Static measurement repeatability(3σ) : 0.6nm Dynamic me...
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Hitachi S-5500
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Process Type: FA SEMs/TEMs/Dual Beams Specifications: Secondary Electron image resolution: 0.4...
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2008 Hitachi SU-70
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Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N//A Date of Manufacture: 2008 Equipment Inf...
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Hitachi S-4700-II
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Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Status of Equipment: Refurbished Configu...
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Hitachi S-4700-I w/EDX
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Status of Equipment: Crated Specification: Secondary electron image resolution: 2.1nm at 1kV 1...
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Hitachi S-4800-II
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Vintage: 2004/2007 Process Type: FA SEMs/TEMs/Dual Beams Status of Equipment: Refurbished Spec...
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2015 Hitachi Brightfield-Darkfield STEM detectors from Hitachi Regulus SU-8XXX
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Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2015 Status of Equipment: De-install...
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Hitachi S-7840
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Process Type: Metrology & Inspection Date of Manufacture: 2001 Refurbished Hitachi S-7840 conf...
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HITACHI S9380II
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2017 HITACHI FIB
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Metrology 8" Convergent ion-B device Offline
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