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Process Type: Metrology & Inspection Date of Manufacture: 2001 Refurbished Hitachi S-7840 conf...

Working Condition. The equipment was operational before de-installing.

Microscope for Critical Dimension Wafer Size Range Minimum 300 mm Maximum 300 mm Set Size 300 m...

Great complete condition It is currently crated Scanning Electron Microscope (SEM) NORAN 700P5...

Working Condition – it’s still in production. It will be released not later than January 31st 20...

Installed in fab – powered off waiting de-install. Complete. No known issues.

De-installed in storage. Complete. Known issue is transfer arm in exchange chamber needs to be ...