Complete S-3200N SEM with Oxford INCAx-act Detector Oxford INCAx-act Detector Vintage 2009 Res...

SEM - Critical Dimension (CD) Measurement Metrology Equipment Date of Manufacture: 2005-07-15 ...

Vintage: 2012 Process Type: FA SEMs/TEMs/Dual Beams Equipment Information: Status of Equipment...

Description Magnetron Condition Very Good

2 available Tool Status Connected Wafer Size 200 mm Fab Section Metrology Asset Description F...

The vacuum pumping system is in good condition Year of manufacture is 1998. Equipped with EDS, ...

Tool Status Connected Wafer Size 200 mm Fab Section Metrology Vintage 2000 Asset Description ...

Tool Status Connected Wafer Size 200 mm Fab Section Metrology Vintage 2001 Asset Description ...

Process Type: CDSEM Date of Manufacture: 2015 Equipment Information: - Includes HDD/SW - Insta...

Scanning Electron Microscope (SEM) Experience the precision and power of the Hitachi S-4800-1 Sc...

Running. It’s in Working Condition but selling As Is. It is complete and HDD & Software Include...

The Hitachi TM-3030Plus Desktop Scanning Electron Microscope is a unit type microscope manufactur...