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Hitachi S-800 Scanning Electron Microscope, Anelva 956-7152, Daia DPF-4Z Parts

▪ SPEC . Windows 2000 . Cold FE type . Type II stage system (fully motorized system) . Vintag...

AS IS TOTAL -4- CARTON 1. MAIN BODY 2. OPERATION UNIT 3. CHILLER 4. TRANSFORMER, Etc.. • ED...

- Secondary electron image resolution: - 1.0nm (15kV, WD=4mm) - 1.4nm (1kV, WD=1.5mm, Decelerat...

- Main body: 1set including Tip, Objective aperture, Ion Pump, SE detection etc. - Diplay unit: ...

Scanning Electron Microscope (SEM) Wafer Size: Equipment Configuration: – Type II – EDX 1) Pe...

- Large chamber- Observable area up to 203mm in diameter- Observation and EDS analysis on a sampl...

- Automatic operation - 5-point measurement 1996 Vintage 5", 6", 8"

Process Type: Metrology & Inspection Date of Manufacture: 2001 Refurbished Hitachi S-7840 conf...

Hitachi CG-5000; 3LP Software: Included CG5000 CD-SEM 3 LP (300mm) 208V E chuck ROI Scan Fast...