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JEOL JSM 7600 F SEM
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Resolution: - 1nm guaranteed at 15kV SEM mode - 2.5nm at 1kV in SEM mode - 1.5nm at 1kV in GB ...
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JEOL JSW-2000
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JEOL Jeol JWS-7700 Wafer Inspection System, WS-75BU, WS-70LCKT/15M,
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2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
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- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with E...
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Jeol EMDSC-U10A Vacuum Dessicator
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Vacuum/purge dessicator PN P11001 with integral vacuum pump 110/115v
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2007 JEOL JWS-2000 WAFER INSPECTION SYSTEM
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WAFER SIZE: 200mm
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JEOL JWS-7555
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JEOL JWS-7555 SEM - Defect Review (DR) Currently Configured for 200mm wafer size MFG Date: TBC...
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JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Working Surplus
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- Model No: JSM-6300F Column - Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope Sys...
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2009 JEOL JSM-7500F
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SEM Vintage: 2009
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JEOL JSM 6301 SEM
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- It was upgraded 5 years ago to Windows control, now running under Windows 10. - There is a thi...
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2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
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Jeol 2100 Probe-Corrected Analytical Electron Microscope - Applications: Aberration-corrected ST...
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1998 JEOL 5600 SEM
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Vintage 1998 EDX and corresponding screen not included
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