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2011 JEOL JSM 7001F Schottky Emission SEM
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Resolution: 1.2 nm at 30 kV, 3.0 nm at 1.0 kV Accelerating Voltage: 0.5 to 30 kV Specimen Stage...
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JEOL LV5900 SEM
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JEOL JXA-8800L Electron Probe Microanalyzer
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LAB Tool
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JEOL JWS-7555 scanning electron microscope
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JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical ...
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JEOL Jeol Controller Cabinet Assembly, JST-10F, 880-9901-1, 307702-A1B-T2
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Used
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JEOL JWS-7700 wafer inspection system
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Used WS-75BU, WS-70LCKT/15M
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JEOL Jeol JSM-5910LV SEM Scanning Electron Microscope Lab
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This Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it ...
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JEOL JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope Lab
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This JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope was removed from a unive...
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JEOL JSM 7600 F SEM
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Resolution: - 1nm guaranteed at 15kV SEM mode - 2.5nm at 1kV in SEM mode - 1.5nm at 1kV in GB ...
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JEOL JSW-2000
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JEOL Jeol JWS-7700 Wafer Inspection System, WS-75BU, WS-70LCKT/15M,
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2007 JEOL JWS-2000 WAFER INSPECTION SYSTEM
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WAFER SIZE: 200mm
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