2011 JEOL JEM 2100 TEM

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Used 2011 JEOL JEM 2100 TEM
- Ion Pump replaced in Jan 2024 - Ability to do bright and dark field TEM, STEM, HRTEM, EDX, SAE...

2011 Jeol JBX 6000 FS/E

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Used 2011 Jeol JBX 6000 FS/E
Wafer Sizes: 8"/200mm Vintage: 2011 . E-Beam Source : ZrO/W TFE . Acc Voltage : 50/25KV . B...

Jeol JEM-2100 TEM Details

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Used
-200KV TEM with analytical capabilities -bottom mount AMT camera -No EDS included but one can b...

JEOL JWS-7700 wafer inspection system

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Used JEOL JWS-7700 wafer inspection system
Used WS-75BU, WS-70LCKT/15M

1997 Jeol JWS 7515 Scanning Electron Microscope (SEM)

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Used 1997 Jeol JWS 7515 Scanning Electron Microscope (SEM)
Condition: “As is” Date of manufacture: 1997 ​Wafer size 150-200mm SEM Field emission electron ...

1999 Jeol JWS 7555 FE-SEM

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Used 1999 Jeol JWS 7555 FE-SEM
Equipment Make: Jeol Equipment Model: JWS 7555 Type: FE-SEM Wafer Size: 8" Equipment Configur...

JEOL Jeol JSM-5910LV SEM Scanning Electron Microscope Lab

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Used JEOL Jeol JSM-5910LV SEM Scanning Electron Microscope Lab
This Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it ...

JEOL JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope Lab

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Used JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope Lab
This JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope was removed from a unive...

JEOL JSM 7600 F SEM

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Used JEOL JSM 6301 SEM
Resolution: - 1nm guaranteed at 15kV SEM mode - 2.5nm at 1kV in SEM mode - 1.5nm at 1kV in GB ...

JEOL JSW-2000

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Used JEOL JSW-2000