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JEOL Jeol Controller Cabinet Assembly, JST-10F, 880-9901-1, 307702-A1B-T2
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Used
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JEOL JWS-7700 wafer inspection system
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Used WS-75BU, WS-70LCKT/15M
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1997 Jeol JWS 7515 Scanning Electron Microscope (SEM)
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Condition: “As is” Date of manufacture: 1997 Wafer size 150-200mm SEM Field emission electron ...
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1999 Jeol JWS 7555 FE-SEM
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Equipment Make: Jeol Equipment Model: JWS 7555 Type: FE-SEM Wafer Size: 8" Equipment Configur...
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JEOL Jeol JSM-5910LV SEM Scanning Electron Microscope Lab
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This Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it ...
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JEOL JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope Lab
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This JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope was removed from a unive...
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JEOL JSM 7600 F SEM
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Resolution: - 1nm guaranteed at 15kV SEM mode - 2.5nm at 1kV in SEM mode - 1.5nm at 1kV in GB ...
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JEOL JSW-2000
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JEOL Jeol JWS-7700 Wafer Inspection System, WS-75BU, WS-70LCKT/15M,
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2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
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- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with E...
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Jeol EMDSC-U10A Vacuum Dessicator
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Vacuum/purge dessicator PN P11001 with integral vacuum pump 110/115v
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JEOL LV5900 SEM
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