JEOL JWS-7700 wafer inspection system

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Used JEOL JWS-7700 wafer inspection system

Jeol JSM 6060

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Used Jeol JSM 6060
Condition: As Is Tungsten SEM with Oxford INCA EDS system. Turbo Pumped System. Available upgr...

JEOL JSM 6060LV

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Used JEOL JSM 6060LV
Condition: As Is

JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Working Surplus

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Used JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Working Surplus
- Model No: JSM-6300F Column - Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope Sys...

JEOL JSM-6400F SEM Scanning Electron Microscope Column Assembly Working Surplus

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Used JEOL JSM-6400F SEM Scanning Electron Microscope Column Assembly Working Surplus
- Model No: JSM-6400F Column - Made in Japan Installed Components - Part No: BEI Preamplifier -...

JEOL JSM-6700F Field Emission Scanning Electron Microscope Edax Detector

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Used JEOL JSM-6700F Field Emission Scanning Electron Microscope Edax Detector
This Jeol JSM-6700F Field Emission Scanning Electron Microscope Edax Detector is in good cosmetic...

2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope

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Used 2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with E...

JEOL JSM-6460LV Scanning Electron Microscope w/(4) Ulvac Vacuum Pumps

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Used JEOL JSM-6460LV Scanning Electron Microscope w/(4) Ulvac Vacuum Pumps
This Jeol JSM-6460LV Scanning Electron Microscope was removed from a lab that was being shut down...

2018 Jeol JEM-2100F SEM

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Used 2018 Jeol JEM-2100F SEM
Condition : good ,as is where is Further specs in images

Jeol JEM 2010 Electron Microscope

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Used Jeol JEM 2010 Electron Microscope
– LaB6 Gun, aligned at 200 keV and 120 KeV – The pole piece is an ARP. Tilt angle alloed ± 30° w...

2000 JEOL JFS-9855S

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Used
Focused Ion Beam System Circuit Analysis and Editing Equipment details: Date of Manufacture: 2...

Jeol JSM 6510

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Used Jeol JSM 6510
Scanning Electron Microscope (SEM)