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Jeol EMDSC-U10A Vacuum Dessicator
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Vacuum/purge dessicator PN P11001 with integral vacuum pump 110/115v
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JEOL LV5900 SEM
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2007 JEOL JWS-2000 WAFER INSPECTION SYSTEM
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WAFER SIZE: 200mm
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JEOL JSW-2000
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Jeol JSM-6400 Scanning Electron Microscope, Oxford Inca Energy Incax-sight, 7663
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This system was removed from a university lab as surplus to requirements. Whilst we have not tes...
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JEOL JWS-7555
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JEOL JWS-7555 SEM - Defect Review (DR) Currently Configured for 200mm wafer size MFG Date: TBC...
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2011 JEOL JSM 7001F Schottky Emission SEM
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Resolution: 1.2 nm at 30 kV, 3.0 nm at 1.0 kV Accelerating Voltage: 0.5 to 30 kV Specimen Stage...
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JEOL JXA-8800L Electron Probe Microanalyzer
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LAB Tool
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JEOL JWS-7700 wafer inspection system
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Used
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JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Working Surplus
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- Model No: JSM-6300F Column - Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope Sys...
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JEOL JSM-6400F SEM Scanning Electron Microscope Column Assembly Working Surplus
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- Model No: JSM-6400F Column - Made in Japan Installed Components - Part No: BEI Preamplifier -...
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JEOL JSM-6700F Field Emission Scanning Electron Microscope Edax Detector
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This Jeol JSM-6700F Field Emission Scanning Electron Microscope Edax Detector is in good cosmetic...
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