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›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Si...

›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Si...

Automatic Surface Inspection System ›Automatic Surface Inspection System ›Bare Wafer Surface De...

KLA SP3 Main Components - • Integrated Console • Bare Wafer Inspection Station • Equipment Fro...

KLA Tencor Puma parts Dalsa Cameras, IMC nodes (Apple G5’s), Laser … etc

KLA Tencor Puma 9130 for spares (with 200mm loadport) (Dalsa Cameras, stage assy, Laser, IMC node...

BrightField Inspection tool 25 cassette HW 200mm GEM/SECS and HSMS Model Enable .12 , .62, .39...

KLA Tencor F5x for 300mm

(0.2um) 3 ports, 2 SMIF (200mm), 1 open cassette 150 / 200 mm Metrology and Defect inspection N...

(0.4um) 3 ports , 1 port 200mm SMIF, 2 x Ports 300mm Metrology and Defect inspection New Installed

(0.2um) 2 ports 200mm SI wafer on tape Defect Wise ADC (AI ADC)